ICP
This is method whereby Inductively Coupled Plasma (ICP) is used to vaporize and excite the element of interest in a sample and determine the wavelength and intensity of the emission spectrum. This method is referred to as ICP optical emission spectrometry (ICP/OES) when used to identify or quantify an element, and ICP mass spectrometry (ICP/MS) when used to determine the concentration of an element in a sample using ICP as an ion source.
In ICP/OES or ICP/MS, the presence of any element that interferes with the detection of the target element in the sample may preclude accurate analysis.
Fujifilm Wako supplies a wide range of standard solutions and mixed standard solutions for ICP analysis that are guaranteed to be suitable for ICP/OES or ICP/MS with controlled impurity elements.
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